Samsung electronics co., ltd. (20250061558). TEST DEVICE AND OPERATING METHOD THEREOF
TEST DEVICE AND OPERATING METHOD THEREOF
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TEST DEVICE AND OPERATING METHOD THEREOF
This abstract first appeared for US patent application 20250061558 titled 'TEST DEVICE AND OPERATING METHOD THEREOF
Original Abstract Submitted
a system for testing whether or not an image sensor included in an image frame is defective includes including a processor configured to execute machine-readable instructions that, when executed by the processor, cause the test device to generate a test image by performing one or more preprocessing operations on a raw image output from an image sensor, and to classify an image pattern of the test image as any one of patterns included in a first data set by using a first deep learning neural network trained based on the first data set and to determine, based on a classifying result, whether or not the image sensor is defective. the first data set comprises a data set for each pattern, classified to correspond to each of one or more defect patterns and to a normal pattern of an image.