Samsung electronics co., ltd. (20250008357). BEAM MEASUREMENT AND REPORTING
BEAM MEASUREMENT AND REPORTING
Organization Name
Inventor(s)
Eko Onggosanusi of Coppell TX US
BEAM MEASUREMENT AND REPORTING
This abstract first appeared for US patent application 20250008357 titled 'BEAM MEASUREMENT AND REPORTING
Original Abstract Submitted
methods and apparatuses for beam measurement and reporting. a method performed by a user equipment (ue) includes transmitting capability information; receiving information indicating a group based beam reporting; and measuring reference signals. the method further includes determining, based on the information and the measurement, a group of two resource indicators; determining, based on the measurement, beam metrics corresponding to the group of two resource indicators; and transmitting, in a channel state information (csi) reporting instance, the group of two resource indicators and the beam metrics. a resource indicator in the group of two resource indicators is one of: (1) a synchronization signal/physical broadcast channel (pbch) block (ssb) resource indicator (ssbri) and (2) a csi reference signal (csi-rs) resource indicator (cri). a beam metric in the beam metrics is one of: (1) a layer-1 reference signal received power (l1-rsrp) and (2) a layer-1 signal to interference and noise ratio (l1-sinr).