APPARATUS AND METHOD WITH IMAGE GENERATION

Organization Name

Inventor(s)

Prashant Pandurang Shinde of Bengaluru (IN)

Shashishekara Parampalli Adiga of Bengaluru (IN)

Priyadarshini Panemangalore Pai of Bengaluru (IN)

APPARATUS AND METHOD WITH IMAGE GENERATION - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240193758 titled 'APPARATUS AND METHOD WITH IMAGE GENERATION

The patent application describes a method for generating images with defect information based on input parameters and defect profiles.

Receiving input parameters for images to be generated.
Generating defect profiles with defect size and location information.
Creating images with defect information using image rendering operations.

Potential Applications: This technology could be used in industries such as manufacturing, quality control, and image processing where the visualization of defects is crucial.

Problems Solved: This technology helps in accurately representing defects in images, which can aid in identifying and addressing issues in various processes.

Benefits: Improved visualization of defects in images, enhanced quality control processes, and better understanding of defect characteristics.

Commercial Applications: Title: Enhanced Image Generation Technology for Quality Control Applications This technology can be utilized in manufacturing plants, medical imaging facilities, and research labs for quality control, defect analysis, and research purposes.

Prior Art: Researchers can explore existing patents related to image rendering, defect visualization, and quality control technologies to understand the background of this innovation.

Frequently Updated Research: Stay updated on advancements in image rendering techniques, defect analysis algorithms, and quality control methodologies to enhance the capabilities of this technology.

Questions about Image Generation with Defect Information: 1. How does this technology improve defect visualization in images? 2. What are the key parameters used to generate defect profiles in this method?

Original Abstract Submitted

a processor-implemented method with image generation includes: receiving a plurality of input parameters for a plurality of images to be generated; generating a plurality of defect profiles comprising a size and location of one or more defects to be formed in an image; and generating the plurality of images comprising defect information based on the plurality of defect profiles and the plurality of input parameters using an image rendering operation.