Nvidia corporation (20240241191). HIGH-BANDWIDTH COAXIAL INTERFACE TEST FIXTURE simplified abstract
HIGH-BANDWIDTH COAXIAL INTERFACE TEST FIXTURE
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HIGH-BANDWIDTH COAXIAL INTERFACE TEST FIXTURE - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240241191 titled 'HIGH-BANDWIDTH COAXIAL INTERFACE TEST FIXTURE
The patent application describes a system for testing multiple devices using a connector holder with multiple holes for cable connectors, a device holder for holding a device in a testing position, and an engagement mechanism to move the connector holder to an engaged position.
- The system includes a connector holder with multiple holes for cable connectors.
- A device holder is used to hold a device in a testing position.
- An engagement mechanism moves the connector holder to an engaged position.
- When a device is held in the testing position and a cable connector is in a hole, a contact point on the connector contacts a signal pad on the device.
Potential Applications: - Testing multiple devices simultaneously - Quality control in manufacturing processes - Research and development for electronic devices
Problems Solved: - Efficient testing of multiple devices - Ensuring proper connectivity between devices and cables - Streamlining testing processes
Benefits: - Time-saving in testing procedures - Improved accuracy in testing results - Cost-effective solution for device testing
Commercial Applications: Title: Multi-Device Testing System for Electronics Manufacturing This technology can be used in electronics manufacturing plants to streamline the testing process, improve efficiency, and ensure the quality of the devices being produced. It can also be utilized in research and development labs for testing prototypes and new electronic devices.
Questions about the technology: 1. How does the engagement mechanism work in moving the connector holder to the engaged position? 2. What are the specific types of devices that can be tested using this system?
Original Abstract Submitted
a system for testing multiple devices includes a connector holder having a plurality of holes, wherein each hole included in the plurality of holes is configured to hold a respective cable connector that connects to a cable; a device holder that is configured to hold a first device in a testing position; and an engagement mechanism that supports the connector holder and is operable to move the connector holder to an engaged position, wherein when the first device is being held by the device holder in the testing position, and a first hole included in the plurality of holes holds a first cable connector, a contact point associated with the first cable connector contacts a signal pad associated with the first device.
