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Nokia technologies oy (20250106659). UE MEASUREMENT BASED UE TRAJECTORY DATA COLLECTION

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UE MEASUREMENT BASED UE TRAJECTORY DATA COLLECTION

Organization Name

nokia technologies oy

Inventor(s)

Ethiraj Alwar of Bangalore IN

Anna Pantelidou of Antony FR

UE MEASUREMENT BASED UE TRAJECTORY DATA COLLECTION

This abstract first appeared for US patent application 20250106659 titled 'UE MEASUREMENT BASED UE TRAJECTORY DATA COLLECTION

Original Abstract Submitted

embodiments of the present disclosure relate to methods, devices, apparatuses and computer readable storage medium for user equipment (ue) trajectory data collection. the method comprises: receiving, at a first apparatus and from a second apparatus, a configuration of one or more minimization of drive test (mdt) measurements associated with a trajectory of the first apparatus; performing the one or more mdt measurements at least based on the configuration; and transmitting trajectory information collected from the one or more mdt measurements to the second apparatus.

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