Nokia technologies oy (20250070902). AI/ML MODEL TEST MECHANISM
AI/ML MODEL TEST MECHANISM
Organization Name
Inventor(s)
Deepa Malapati Ravindraiah of Bangalore (IN)
Fahad Syed Muhammad Fahad of Massy (FR)
Muhammad Ikram Ashraf of Espoo (FI)
AI/ML MODEL TEST MECHANISM
This abstract first appeared for US patent application 20250070902 titled 'AI/ML MODEL TEST MECHANISM
Original Abstract Submitted
example embodiments of the present disclosure are related to artificial intelligence/machine learning (ai/ml) model test. a first apparatus transmits test configuration information to a second apparatus, the test configuration information indicating a test mode of an ai/ml model with respect to at least one transmission and reception unit (trp), the at least one trp being arranged within an environment based on a test plan for at least one test channel indicator. the first apparatus receives, from the second apparatus, at least one predicted channel indicator for the at least one trp, the at least one predicted channel indicator being derived by the second apparatus using the ai/ml model. the first apparatus determines a test result for the ai/ml model based on a comparison between the at least one predicted channel indicator and the at least one test channel indicator, the test result indicating whether the ai/ml model is validated.