Nec corporation (20250003891). FOREIGN OBJECT INSPECTION DEVICE
FOREIGN OBJECT INSPECTION DEVICE
Organization Name
Inventor(s)
Masahiro Yamaguchi of Tokyo JP
FOREIGN OBJECT INSPECTION DEVICE
This abstract first appeared for US patent application 20250003891 titled 'FOREIGN OBJECT INSPECTION DEVICE
Original Abstract Submitted
a foreign object inspection device includes an acquisition means and a determination means. the acquisition means acquires an image around a liquid surface in the shape of a paraboloid of revolution in a transparent container. the liquid surface in the shape of a paraboloid of revolution is formed when the transparent container containing a transparent liquid is rotated about a central axis at a given speed. the image is captured from a side of the transparent container under the transmitted illumination. the determination means acquires a luminance value of a pixel along a line extending in a direction parallel to the central axis in the image, generates one-dimensional data of the luminance values, and on the basis of a spatial change in the luminance values in the one-dimensional data, determines whether or not there is a foreign object on the liquid surface.