HYBRID WIRE LOCALIZATION LENGTH MEASUREMENT DEVICE

Organization Name

microsoft technology licensing, llc

Inventor(s)

Eoin Conor O’farrell of Frederiksberg (DK)

Roland Zeisel of Copenhagen (DK)

Roman Mykolayovych Lutchyn of Santa Barbara CA (US)

Tom Marijn Laeven of Delft (NL)

Kevin Alexander Van Hoogdalem of Alphen aan den Rijn (NL)

Naganivetha Thiyagarajah of Copenhagen (DK)

Andrey Antipov of Santa Barbara CA (US)

William Scott Cole, Jr. of Sammamish WA (US)

HYBRID WIRE LOCALIZATION LENGTH MEASUREMENT DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240295393 titled 'HYBRID WIRE LOCALIZATION LENGTH MEASUREMENT DEVICE

The abstract describes a superconductor-semiconductor device with a hybrid superconductor-semiconductor wire and a hybrid localization length (ll) measurement device.

The device includes a plurality of contact gates above the hybrid wire in a thickness direction.
A conductance sensor is electrically coupled to the contact gates.
The device allows for measuring the localization length of the hybrid superconductor-semiconductor wire.

Potential Applications:

Quantum computing
High-speed electronics
Sensing applications

Problems Solved:

Enhancing the performance of superconductor-semiconductor devices
Improving measurement accuracy of localization length

Benefits:

Increased efficiency in quantum computing
Enhanced performance in high-speed electronics
Improved sensitivity in sensing applications

Commercial Applications:

Semiconductor industry
Research institutions
Electronics manufacturers

Questions about the technology: 1. How does the hybrid superconductor-semiconductor wire improve device performance? 2. What are the potential challenges in integrating this technology into existing systems?

Frequently Updated Research: Researchers are continuously exploring new materials and configurations to further enhance the performance of superconductor-semiconductor devices.

Original Abstract Submitted

a superconductor-semiconductor device is provided, including a hybrid superconductor-semiconductor wire. the superconductor-semiconductor device may further include a hybrid localization length (ll) measurement device including a plurality of contact gates located above the hybrid superconductor-semiconductor wire in a thickness direction. the hybrid ll measurement device may further include a conductance sensor electrically coupled to the plurality of contact gates.