Micron technology, inc. (20250110643). APPARATUSES AND METHODS FOR BOUNDED FAULT COMPLIANT METADATA STORAGE
APPARATUSES AND METHODS FOR BOUNDED FAULT COMPLIANT METADATA STORAGE
Organization Name
Inventor(s)
Sujeet Ayyapureddi of Boise ID US
APPARATUSES AND METHODS FOR BOUNDED FAULT COMPLIANT METADATA STORAGE
This abstract first appeared for US patent application 20250110643 titled 'APPARATUSES AND METHODS FOR BOUNDED FAULT COMPLIANT METADATA STORAGE
Original Abstract Submitted
apparatuses, systems, and methods for bounded fault compliant metadata storage. a memory module may be capable of repairing information along a portion of the data terminals of a memory device. to prevent errors in the metadata from propagating across more than the correctable portion, the metadata may be provided along a portion of the data terminals, while the data associated with that metadata is provided along more data terminals. for example, in a 9�2p2 module the data may use two terminals, while the metadata only uses one. in a 5�2p4 module, the metadata may use a pair of terminals, while the data uses four.