Micron technology, inc. (20240427657). BOOTLOADER FAILURE ANALYSIS OF MEMORY SYSTEM
BOOTLOADER FAILURE ANALYSIS OF MEMORY SYSTEM
Organization Name
Inventor(s)
Jianping Tian of Shanghai (CN)
BOOTLOADER FAILURE ANALYSIS OF MEMORY SYSTEM
This abstract first appeared for US patent application 20240427657 titled 'BOOTLOADER FAILURE ANALYSIS OF MEMORY SYSTEM
Original Abstract Submitted
various embodiments described herein provide for bootloader failure analysis of a memory system using information regarding a failure of the bootloader, where the information is stored on the memory sub-system in response to detection of (e.g., stored at the time of) the failure. in particular, the stored information can comprise data that would be lost or otherwise inaccessible for subsequent diagnostic (e.g., debug) purposes, such as by a manufacturer of the memory sub-system. according to some embodiments, a memory sub-system is configured to save information regarding a failure of a bootloader, to one or more designated memory devices of the memory sub-system, such that diagnostic firmware (e.g., debug firmware) subsequently loaded and executed on the memory sub-system (e.g., by a manufacturer) can make use of the stored information to perform one or more diagnostic functions (e.g., debug functions) on the memory sub-system.