Micron technology, inc. (20240411470). TEMPERATURE CONTROLLED ZONE CREATION AND ALLOCATION

TEMPERATURE CONTROLLED ZONE CREATION AND ALLOCATION

Organization Name

micron technology, inc.

Inventor(s)

Shiva Pahwa of Bangalore (IN)

Abhilash Ramamurthy Nag of Bangalore (IN)

Sathyashankara Bhat Muguli of Bangalore (IN)

TEMPERATURE CONTROLLED ZONE CREATION AND ALLOCATION

This abstract first appeared for US patent application 20240411470 titled 'TEMPERATURE CONTROLLED ZONE CREATION AND ALLOCATION

Original Abstract Submitted

respective temperature values for a plurality of dies of a memory device is obtained. each respective temperature value is indicative of a temperature at a corresponding die of the plurality of dies of the memory device. the plurality of dies based on the respective temperature values, each die of the plurality of dies is ordered. a zone creation command directed to the memory device is received from a host. the zone creation command on the memory device on a die of the ordered plurality of dies is performed based on a temperature threshold.