MITUTOYO CORPORATION Patent Application Trends in 2025

MITUTOYO CORPORATION patent applications in 2025

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Top 10 Technology Areas

• G01B11/2504 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS)
  • Count: 2 patents
  • Example: 20250035430. CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM (MITUTOYO CORPORATION)
• G01B11/2513 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS)
  • Count: 2 patents
  • Example: 20250035430. CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM (MITUTOYO CORPORATION)
• G01D5/20 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR)
  • Count: 2 patents
  • Example: 20250067578. ENCODER (MITUTOYO CORPORATION)
• G01B7/30 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS)
  • Count: 2 patents
  • Example: 20250067578. ENCODER (MITUTOYO CORPORATION)
• H04N23/55 (PICTORIAL COMMUNICATION, e.g. TELEVISION)
  • Count: 2 patents
  • Example: 20250004263. METROLOGY SYSTEM UTILIZING ANNULAR OPTICAL CONFIGURATION (Mitutoyo Corporation)
• H04N23/74 (PICTORIAL COMMUNICATION, e.g. TELEVISION)
  • Count: 2 patents
  • Example: 20250004263. METROLOGY SYSTEM UTILIZING ANNULAR OPTICAL CONFIGURATION (Mitutoyo Corporation)
• G06T7/13 (Edge detection)
  • Count: 2 patents
  • Example: 20250005793. GRADUATION-PLATE POSTURE INSPECTION METHOD (MITUTOYO CORPORATION)
• G06T7/60 (Analysis of geometric attributes)
  • Count: 2 patents
  • Example: 20250005793. GRADUATION-PLATE POSTURE INSPECTION METHOD (MITUTOYO CORPORATION)
• G02B3/14 (OPTICAL ELEMENTS, SYSTEMS OR APPARATUS)
  • Count: 2 patents
  • Example: 20250047960. VARIABLE FOCAL LENGTH LENS DEVICE (MITUTOYO CORPORATION)
• G06K7/1413 (using light without selection of wavelength, e.g. sensing reflected white light {()
  • Count: 1 patents
  • Example: 20250035430. CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM (MITUTOYO CORPORATION)

Emerging Technology Areas

• H04N23/682 (for stable pick-up of the scene, e.g. compensating for camera body vibrations)
  • Count: 1 patents
  • Example: 20250088754. IMAGE DETECTION DEVICE AND IMAGE DETECTION METHOD (MITUTOYO CORPORATION)
• H04N23/6812 (for stable pick-up of the scene, e.g. compensating for camera body vibrations)
  • Count: 1 patents
  • Example: 20250088754. IMAGE DETECTION DEVICE AND IMAGE DETECTION METHOD (MITUTOYO CORPORATION)
• B23K26/355 (SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM (making metal-coated products by extruding metal)
  • Count: 1 patents
  • Example: 20250085138. SCALE, ENCODER AND MANUFACTURING METHOD OF SCALE (MITUTOYO CORPORATION)
• G01D5/245 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR)
  • Count: 1 patents
  • Example: 20250085138. SCALE, ENCODER AND MANUFACTURING METHOD OF SCALE (MITUTOYO CORPORATION)
• G06T2207/30164 (Subject of image; Context of image processing)
  • Count: 1 patents
  • Example: 20250029228. MACHINE VISION SYSTEM WITH OBJECTIVE LENS AND COLLISION PROTECTION (Mitutoyo Corporation)
• H04N23/695 (Control of camera direction for changing a field of view, e.g. pan, tilt or based on tracking of objects)
  • Count: 1 patents
  • Example: 20250029228. MACHINE VISION SYSTEM WITH OBJECTIVE LENS AND COLLISION PROTECTION (Mitutoyo Corporation)
• G06T7/0004 ({Industrial image inspection})
  • Count: 1 patents
  • Example: 20250029228. MACHINE VISION SYSTEM WITH OBJECTIVE LENS AND COLLISION PROTECTION (Mitutoyo Corporation)
• G01B7/003 (Measuring arrangements characterised by the use of electric or magnetic techniques)
  • Count: 1 patents
  • Example: 20250076086. INDUCTIVE POSITION TRANSDUCER SYSTEM WITH IMPEDANCE CIRCUIT PORTION (Mitutoyo Corporation)
• G01D5/2208 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR)
  • Count: 1 patents
  • Example: 20250076086. INDUCTIVE POSITION TRANSDUCER SYSTEM WITH IMPEDANCE CIRCUIT PORTION (Mitutoyo Corporation)
• G01B3/38 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS)
  • Count: 1 patents
  • Example: 20250076021. AUTOMATIC MEASURING APPARATUS (MITUTOYO CORPORATION)

Top Inventors

• Ryosuke TANAKA (2 patents)
• Yuji SADAHIRA (2 patents)
• Hiroyuki Yoshida (2 patents)
• Yuji Sadahira (2 patents)
• Yuki Yamasaki (2 patents)
• Masashi YAMAJI (2 patents)
• Chihiro YAMAMOTO (2 patents)
• Shuji HAYASHIDA (2 patents)
• Keita OGAWA (2 patents)
• Takeshi SAEKI (1 patent)

Patent Categories

Geographical Distribution of Inventors

Geographical Distribution of US Inventors