Japan display inc. (20250147347). METHOD FOR INSPECTING REFLECTING DEVICE
METHOD FOR INSPECTING REFLECTING DEVICE
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METHOD FOR INSPECTING REFLECTING DEVICE
This abstract first appeared for US patent application 20250147347 titled 'METHOD FOR INSPECTING REFLECTING DEVICE
Original Abstract Submitted
a method for inspecting a reflecting device, which has a plurality of reflecting elements arrayed in a matrix, each of the plurality of reflecting elements comprises a patch electrode, a common electrode on a back side of the patch electrode, and a liquid crystal layer between the patch electrode and the common electrode, a first voltage v is applied between one of the plurality of patch electrodes and the common electrode, and whether the reflecting element is good or bad is determined based on changes in a frame region that appears around a periphery of one of the plurality of patch electrodes in a top view when a voltage is applied between one of the plurality of patch electrodes and the common electrode.