IonQ, Inc. (20250124322). SYSTEM AND METHOD FOR BACKGROUND-FREE QUBIT STATE MEASUREMENT
SYSTEM AND METHOD FOR BACKGROUND-FREE QUBIT STATE MEASUREMENT
Organization Name
Inventor(s)
Jonathan Mizrahi of Silver Spring MD US
SYSTEM AND METHOD FOR BACKGROUND-FREE QUBIT STATE MEASUREMENT
This abstract first appeared for US patent application 20250124322 titled 'SYSTEM AND METHOD FOR BACKGROUND-FREE QUBIT STATE MEASUREMENT
Original Abstract Submitted
aspects of the present disclosure relate generally to systems and methods for use in the implementation and/or operation of quantum information processing (qip) systems, and more particularly, for background-free qubit measurement. in some aspects, a method includes controlling a photon source oriented to direct photons towards ion(s) in an ion trap to produce photons having a first wavelength for a first time period; stopping the photon source from producing photons having the first wavelength; activating a photon detector configured to detect photons having the first wavelength; controlling the photon source to produce photons having a second wavelength different than the first wavelength for a second time period; detecting photons having the first wavelength during the second time period; and determining, based on detection of photons having the first wavelength during the second time period, that at least one of the one or more ions is in a |1> state.