Intel corporation (20250142375). PRE-CONFIGURED MEASUREMENT GAP (MG) TESTING PROCEDURE
PRE-CONFIGURED MEASUREMENT GAP (MG) TESTING PROCEDURE
Organization Name
Inventor(s)
Rui Huang of Santa Clara CA US
In-Seok Hwang of Santa Clara CA US
PRE-CONFIGURED MEASUREMENT GAP (MG) TESTING PROCEDURE
This abstract first appeared for US patent application 20250142375 titled 'PRE-CONFIGURED MEASUREMENT GAP (MG) TESTING PROCEDURE
Original Abstract Submitted
various embodiments herein provide techniques related to measurements in a testing scenario by a user equipment (ue) that is configured to use a pre-configured measurement gap (pre-mg). in embodiments, the ue may be configured to perform one or more measurements with the pre-mg disabled. the pre-mg may then be enabled and the ue may perform additional measurements. in this way, a plurality of parameters related to the ue and/or the pre-mg may be identified based on the testing scenario. other embodiments may be described and/or claimed.