MEASUREMENT METHOD AND APPARATUS

Organization Name

huawei technologies co., ltd.

Inventor(s)

Yourui Huangfu of Hangzhou CN

Jian Wang of Hangzhou CN

Rong Li of Boulogne Billancourt FR

MEASUREMENT METHOD AND APPARATUS

This abstract first appeared for US patent application 20250119669 titled 'MEASUREMENT METHOD AND APPARATUS

Original Abstract Submitted

this application provides a measurement method and apparatus. the method includes: a first device obtains a kfirst sensing result output by a first sensing neural network usable for a first sensing task, the kfirst sensing result is determined based on measurement results of n measurement devices that are obtained through selection from m measurement devices for k times based on a selection neural network, 1≤k≤n<m, and k, m, and n are positive integers. when a selection termination condition is not met, the first device selects l measurement devices based on the selection neural network and the kfirst sensing result, where 1≤l<m, and lis a positive integer. the first device obtains a (k+1)first sensing result output by the first sensing neural network, where the (k+1)first sensing result is determined based on measurement results of the n measurement devices and the l measurement devices.