Honeywell international inc. (20240280360). LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY simplified abstract
LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY
Organization Name
Inventor(s)
Gertjan Job Hofman of Vancouver (CA)
Sebastien Tixier of North Vancouver (CA)
LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240280360 titled 'LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY
The patent application describes a system with a top scanner head positioned over a coated substrate, along with an x-ray sensor and a second x-ray sensor that scan the coated substrate. The sensors are tuned to different energy levels relative to an absorption peak, and they scan the same spot on the substrate. A bottom scanner head underneath the substrate detects the x-rays for the sensors.
- X-ray sensors and second x-ray sensors are used to scan a coated substrate.
- Sensors are tuned to different energy levels, one below and one above an absorption peak.
- Both sensors scan the same spot on the substrate.
- A bottom scanner head is positioned underneath the substrate to detect x-rays for the sensors.
Potential Applications: - Quality control in manufacturing processes involving coated substrates. - Non-destructive testing of coatings on various materials. - Research and development in the field of material science.
Problems Solved: - Efficient and accurate scanning of coated substrates. - Detection of defects or inconsistencies in coatings. - Optimization of manufacturing processes.
Benefits: - Improved quality control. - Enhanced accuracy in detecting coating issues. - Time and cost savings in manufacturing processes.
Commercial Applications: Title: Advanced Coating Inspection System for Manufacturing Processes This technology can be utilized in industries such as automotive, aerospace, and electronics for quality control and inspection of coated materials. It can streamline production processes and ensure the reliability of coated products in the market.
Questions about the technology: 1. How does the system differentiate between different energy levels for scanning the coated substrate? 2. What are the advantages of using x-ray sensors for inspecting coated materials compared to other methods?
Frequently Updated Research: Researchers are continually exploring new ways to enhance the sensitivity and accuracy of x-ray sensors for inspecting coated substrates. Stay updated on the latest developments in this field to leverage the most advanced technologies for quality control and manufacturing processes.
Original Abstract Submitted
a system includes a top scanner head configured over a coated substrate. an x-ray sensor and a second x-ray sensor scan the coated substrate. at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. the x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. a bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.