Fujifilm corporation (20240426858). EXAMINATION APPARATUS
EXAMINATION APPARATUS
Organization Name
Inventor(s)
Yoshinobu Miura of Kanagawa (JP)
EXAMINATION APPARATUS
This abstract first appeared for US patent application 20240426858 titled 'EXAMINATION APPARATUS
Original Abstract Submitted
an examination apparatus includes: a detecting unit that detects a target substance; a specimen dispensing unit and a moving mechanism which moves the sampling nozzle; a nozzle imaging camera; and a processor that is configured to control the specimen dispensing unit and the nozzle imaging camera. the processor is configured to acquire an image of the sampling nozzle in a state of holding the specimen after the specimen is suctioned through the sampling nozzle and before the specimen is discharged to the reaction cell through the sampling nozzle, from the nozzle imaging camera, determine whether or not a formed element is present in the specimen, on the basis of the image, and discard an upper layer of the specimen accommodated in the specimen collection container, the upper layer including the formed element, by controlling the specimen dispensing unit in a case of determining that the formed element is present.