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Contemporary amperex technology co., limited (20240426937). TEST SYSTEM AND TEST METHOD THEREFOR

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TEST SYSTEM AND TEST METHOD THEREFOR

Organization Name

contemporary amperex technology co., limited

Inventor(s)

Jiawu Cheng of Ningde (CN)

Xueqing Gong of Ningde (CN)

Guangwei Zhou of Ningde (CN)

Kai Zhou of Ningde (CN)

Haijie Wang of Ningde (CN)

TEST SYSTEM AND TEST METHOD THEREFOR

This abstract first appeared for US patent application 20240426937 titled 'TEST SYSTEM AND TEST METHOD THEREFOR



Original Abstract Submitted

a test system comprises a test circuit board, a test device, a lower computer, and an upper computer. the test circuit board includes a test circuit, the test circuit comprising multiple main lines arranged side by side, one end of each of the main lines being used to connect with a positive electrode or a negative electrode of each battery cell of the battery module, and the other end of each of the main lines being connected with a first branch and a second branch. the lower computer controls a first branch connected to one of the main lines to be electrically conductive to a positive electrode of the test device and a second branch connected to another one of the main lines to be electrically conductive to a negative electrode of the test device. the upper computer controls the lower computer and reads parameter information for the test device.

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