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Contemporary amperex technology co., limited (20240426936). INSPECTION CIRCUIT AND METHOD

From WikiPatents

INSPECTION CIRCUIT AND METHOD

Organization Name

contemporary amperex technology co., limited

Inventor(s)

Haijie Wang of Ningde (CN)

Xueqing Gong of Ningde (CN)

Guangwei Zhou of Ningde (CN)

Jiawu Cheng of Ningde (CN)

Jiacai Wang of Ningde (CN)

INSPECTION CIRCUIT AND METHOD

This abstract first appeared for US patent application 20240426936 titled 'INSPECTION CIRCUIT AND METHOD



Original Abstract Submitted

an inspection circuit includes a plurality of inspection devices and a plurality of pathway switching circuits. input ends of the pathway switching circuits are respectively connected to different test lines. the test lines are connected to a test terminal corresponding to a battery cell under test. output ends of the pathway switching circuits are respectively connected to the plurality of inspection devices. the pathway switching circuit is configured to connect, according to an inspection signal, an inspection device corresponding to the inspection signal and a test terminal corresponding to the battery cell under test. the inspection device is configured to obtain an inspection result of the battery cell under test.

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