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Cisco technology, inc. (20240241309). OPTICAL WAFER-SCALE PHOTODIODE BANDWIDTH MEASUREMENT SYSTEM simplified abstract

From WikiPatents

OPTICAL WAFER-SCALE PHOTODIODE BANDWIDTH MEASUREMENT SYSTEM

Organization Name

cisco technology, inc.

Inventor(s)

Attila Mekis of Carlsbad CA (US)

Gianlorenzo Masini of Carlsbad CA (US)

OPTICAL WAFER-SCALE PHOTODIODE BANDWIDTH MEASUREMENT SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240241309 titled 'OPTICAL WAFER-SCALE PHOTODIODE BANDWIDTH MEASUREMENT SYSTEM

Simplified Explanation: The patent application describes an optical system for testing the bandwidth of a photodiode in a photonic integrated circuit. The system involves providing optical signals to bias the photodiode and generate an AC signal for testing its bandwidth.

  • The optical system tests the bandwidth of a photodiode in a photonic integrated circuit.
  • A first optical signal biases the photodiode to generate a DC bias across it.
  • A second optical signal is directed to the photodiode to generate an AC signal for testing.
  • The second optical signal can be tuned to vary its frequency/wavelength for bandwidth testing.
  • The AC signal generated by the photodiode is passed through a heating element and measured by an interferometer.
  • The output of the interferometer correlates to the bandwidth of the photodiode.

Potential Applications: 1. Testing and optimizing the performance of photodiodes in photonic integrated circuits. 2. Research and development in the field of optical communication systems. 3. Quality control in manufacturing processes of photonic devices.

Problems Solved: 1. Efficient and accurate testing of the bandwidth of photodiodes. 2. Facilitating the development of high-performance photonic integrated circuits. 3. Enhancing the reliability and functionality of optical communication systems.

Benefits: 1. Improved performance and reliability of photonic integrated circuits. 2. Streamlined testing processes for photodiodes. 3. Enhanced quality control in manufacturing photonic devices.

Commercial Applications: Optical System for Testing Photodiode Bandwidth: Market Implications and Commercial Uses

Questions about Optical System for Testing Photodiode Bandwidth: 1. How does the optical system accurately measure the bandwidth of the photodiode? 2. What are the potential advancements in optical communication systems that could result from this technology?

Frequently Updated Research: Ongoing research in the field of photonic integrated circuits and optical communication systems may lead to further advancements in testing methodologies for photodiodes.


Original Abstract Submitted

embodiments herein described an optical system for testing the bandwidth of a photodiode (pd) in a photonic integrated circuit (pic). in one embodiment, a first optical signal is provided to bias one or more pds in the pic which generate a dc bias (e.g., dc voltage) across the pd whose bandwidth is being tested. a second optical signal is directed to the pd being tested, thereby generating an ac signal. the second optical signal can be a tunable optical signal where its frequency/wavelength is varied to test the bandwidth of the pd. the ac signal generated by the pd being tested is passed through a heating element (e.g., a resistor) which generates heat. this heat is then measured by an interferometer. the output of the interferometer can be correlated to a bandwidth of the pd.

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