Category:Young Yoon of Suwon-si KR
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Young Yoon
Young Yoon from Suwon-si KR has applied for patents in technology areas such as MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR with Samsung Electronics Co., Ltd..
Patents
Pages in category "Young Yoon of Suwon-si KR"
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