Category:Yaofeng ZHANG
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Yaofeng ZHANG
Executive Summary
Yaofeng ZHANG is an inventor who has filed 1 patents. Their primary areas of innovation include Stabilisation of spectrometers (1 patents), MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry (1 patents), and they have worked with companies such as National Institute of Metrology, China (1 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).
Patent Filing Activity
Technology Areas
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List of Technology Areas
- G01T1/40 (Stabilisation of spectrometers): 1 patents
- G01T1/023 (MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry): 1 patents
Companies
List of Companies
- National Institute of Metrology, China: 1 patents
Collaborators
- Jianwei HUANG (1 collaborations)
- Dehong LI (1 collaborations)
- Lei CAO (1 collaborations)
- Xuan ZHANG (1 collaborations)
- Xiaole ZHANG (1 collaborations)
- Chuanfeng LIU (1 collaborations)
- Jian ZHANG (1 collaborations)
- Zhan LIU (1 collaborations)
- Yang YANG (1 collaborations)
Subcategories
This category has the following 8 subcategories, out of 8 total.