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Category:Sergei F. Burlatsky of West Hartford CT US

From WikiPatents

Sergei F. Burlatsky

Sergei F. Burlatsky from West Hartford CT US has applied for patents in technology areas such as B22F10/80, B22F10/37, B22F12/90 with RTX CORPORATION.

Patents

LOCATION-SPECIFIC PROBABILISTIC APPROACH FOR PREDICTION OF DEFECT FORMATION IN ADDITIVE MANUFACTURING (20250128330)

Pages in category "Sergei F. Burlatsky of West Hartford CT US"

The following 4 pages are in this category, out of 4 total.

1

18492078. LOCATION-SPECIFIC PROBABILISTIC APPROACH FOR PREDICTION OF DEFECT FORMATION IN ADDITIVE MANUFACTURING (RTX CORPORATION)
18494854. METHOD FOR ADDITIVELY MANUFACTURED PROCESS-EQUIVALENT TEST SPECIMENS (RTX CORPORATION)

2

20250231113. Method Rapid Characterizat (RTX)

R

RTX CORPORATION (20250128330). LOCATION-SPECIFIC PROBABILISTIC APPROACH FOR PREDICTION OF DEFECT FORMATION IN ADDITIVE MANUFACTURING

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