Category:Gerald K. Mletzko, JR. of Pine City NY (US)

Gerald K. Mletzko, JR. of Pine City NY (US)

Executive Summary

Gerald K. Mletzko, JR. of Pine City NY (US) is an inventor who has filed 4 patents. Their primary areas of innovation include {Testing of electric installations on transport means} (2 patents), Measuring probes (1 patents), General constructional details (1 patents), and they have worked with companies such as Lockheed Martin Corporation (4 patents). Their most frequent collaborators include (4 collaborations), (3 collaborations), (2 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G01R31/005 ({Testing of electric installations on transport means}): 2 patents
• G01R1/067 (Measuring probes): 1 patents
• G01R1/025 (General constructional details): 1 patents
• G01R31/50 (Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs): 1 patents
• G01R1/203 (Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments): 1 patents
• G01R1/28 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits): 1 patents
• G01R15/144 (Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks): 1 patents
• G01R31/2621 (Testing of individual semiconductor devices (testing or measuring during manufacture or treatment {): 1 patents
• G01R31/2632 (Testing of individual semiconductor devices (testing or measuring during manufacture or treatment {): 1 patents
• G01R31/2834 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 1 patents
• G01R27/025 ({Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters}): 1 patents
• G01R31/2837 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 1 patents
• G01R31/54 (Testing for continuity): 1 patents
• G01R31/67 (Testing the correctness of wire connections in electric apparatus or circuits): 1 patents
• H04W24/10 (Scheduling measurement reports {; Arrangements for measurement reports}): 1 patents
• G01R31/69 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits): 1 patents

Companies

List of Companies

• Lockheed Martin Corporation: 4 patents

Collaborators

• Kevin Bell of Vestal NY (US) (4 collaborations)
• Gibson Richard Garner of Marietta GA (US) (3 collaborations)
• John Foster Braddy of Cumming GA (US) (2 collaborations)
• John Daniel Semmens of Sandy Springs GA (US) (2 collaborations)
• Samuel Jasper Franklin of Marietta GA (US) (2 collaborations)
• Jason Phang of Mount Laurel NJ (US) (1 collaborations)
• Patrick M. Langan of Columbia MD (US) (1 collaborations)
• Jennifer Lynn Kotski of Endicott NY (US) (1 collaborations)