Category:Alain F. Loiseau of Williston VT (US)

Alain F. Loiseau of Williston VT (US)

Executive Summary

Alain F. Loiseau of Williston VT (US) is an inventor who has filed 2 patents. Their primary areas of innovation include Marks applied to semiconductor devices {or parts}, e.g. registration marks, {alignment structures, wafer maps (test patterns for characterising or monitoring manufacturing processes (1 patents), Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (1 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (1 patents), and they have worked with companies such as GlobalFoundries U.S. Inc. (2 patents). Their most frequent collaborators include (2 collaborations), (2 collaborations), (1 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• H01L23/544 (Marks applied to semiconductor devices {or parts}, e.g. registration marks, {alignment structures, wafer maps (test patterns for characterising or monitoring manufacturing processes): 1 patents
• G01R31/2887 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 1 patents
• H01L23/5226 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
• H01L2223/54413 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
• G06Q30/0185 ({Product, service or business identity fraud}): 1 patents
• G06K7/1404 (using light without selection of wavelength, e.g. sensing reflected white light {(): 1 patents

Companies

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List of Companies

• GlobalFoundries U.S. Inc.: 2 patents

Collaborators

• Romain H.A. Feuillette of Williston VT (US) (2 collaborations)
• Peter T. Coutu of Williston VT (US) (2 collaborations)
• Mujahid Muhammad of Essex Junction VT (US) (1 collaborations)