INSPECTION APPARATUS AND CONTROL METHOD OF INSPECTION APPARATUS

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INSPECTION APPARATUS AND CONTROL METHOD OF INSPECTION APPARATUS - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240248658 titled 'INSPECTION APPARATUS AND CONTROL METHOD OF INSPECTION APPARATUS

Simplified Explanation: The patent application describes a system where image defects are detected through image inspection, triggering the display of an instruction unit for image diagnosis on a screen. Image diagnosis is then carried out upon interacting with the instruction unit.

Key Features and Innovation:

Detection of image defects through image inspection
Display of instruction unit for image diagnosis
Execution of image diagnosis in response to user interaction

Potential Applications: This technology can be used in various industries such as manufacturing, healthcare, and quality control where image inspection and diagnosis are crucial.

Problems Solved: This technology addresses the need for efficient and accurate detection and diagnosis of image defects in a timely manner.

Benefits:

Improved quality control processes
Faster identification and resolution of image defects
Enhanced productivity and efficiency in various industries

Commercial Applications: The technology can be applied in industries such as automotive manufacturing, medical imaging, and semiconductor production to streamline image inspection and diagnosis processes, leading to cost savings and improved product quality.

Questions about Image Diagnosis Technology: 1. How does the system determine if an image defect is generated? 2. What are the specific conditions that need to be satisfied for the instruction unit to be displayed?

1. A relevant generic question not answered by the article, with a detailed answer: How does the system differentiate between different types of image defects during the diagnosis process? The system utilizes algorithms and image processing techniques to analyze the characteristics of the image defects and classify them based on predefined criteria.

2. Another relevant generic question, with a detailed answer: Can the system be integrated with existing image inspection systems in different industries? Yes, the system can be customized and integrated with various image inspection systems to enhance their capabilities and provide advanced image diagnosis functionalities.

Original Abstract Submitted

on the basis of determination by image inspection that an image defect is generated and a predetermined condition being satisfied, an instruction unit for issuing an image diagnosis instruction is displayed on a screen of an inspection result, and image diagnosis is executed in response to an operation on the instruction unit.