Battelle Memorial Institute (20250086751). MULTIMODAL INSPECTION SYSTEM
MULTIMODAL INSPECTION SYSTEM
Organization Name
Inventor(s)
Anthony George of Columbus (CA)
Thomas Kent of Columbus OH (US)
Blaine Miller of Columbus OH (US)
Katie Liszewski of Columbus OH (US)
Russell Gilabert of Columbus OH (US)
Timothy Mcdonley of Columbus OH (US)
MULTIMODAL INSPECTION SYSTEM
This abstract first appeared for US patent application 20250086751 titled 'MULTIMODAL INSPECTION SYSTEM
Original Abstract Submitted
a multimodal inspection system (mis) is disclosed herein. the mis may use one or more modalities to inspect a sample. some of the modalities include, but are not limited to, raman, visible (vis), terahertz (thz) spectroscopy, longwave infrared (lwir), shortwave infrared (swir), laser profilometry (lp), electromagnetic interference (emi) near field probing, and/or, millimeter wave (mmw) radar.