Electromagnetic Radiation Detectors with Lattice-Matched Epitaxial Anti-Reflection Structures

Organization Name

apple inc.

Inventor(s)

Matthew T. Morea of Cupertino CA (US)

Daniel Mahgerefteh of Campbell CA (US)

Dylan N. Rees of Los Gatos CA (US)

Mark A. Arbore of Los Altos CA (US)

Romain F. Chevallier of Santa Clara CA (US)

Electromagnetic Radiation Detectors with Lattice-Matched Epitaxial Anti-Reflection Structures

This abstract first appeared for US patent application 20240405135 titled 'Electromagnetic Radiation Detectors with Lattice-Matched Epitaxial Anti-Reflection Structures

Original Abstract Submitted

an electromagnetic radiation detectors includes anti-reflective epitaxial structures incorporated into an epitaxial stack of the electromagnetic radiation detector. an anti-reflective structures as described herein are grown between (and thereby connect) two lattice-matched epitaxial layers that have different refractive indices. the anti-reflective structure reduces fresnel reflections that would otherwise occur if the two epitaxial layers were directly connected.