ANRITSU CORPORATION Patent Application Trends in 2025
ANRITSU CORPORATION Patent Filing Activity
ANRITSU CORPORATION patent applications in 2025
Top 10 Technology Areas
- G01N23/04 (and forming images of the material)
- Count: 4 patents
- Example: 20250116616. ARTICLE INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N23/083 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 4 patents
- Example: 20250116616. ARTICLE INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N2223/643 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 4 patents
- Example: 20250116616. ARTICLE INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N2223/3307 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 3 patents
- Example: 20250116616. ARTICLE INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N2223/401 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 2 patents
- Example: 20250116616. ARTICLE INSPECTION APPARATUS (ANRITSU CORPORATION)
- G06T2207/10116 (Image acquisition modality)
- Count: 2 patents
- Example: 20250116616. ARTICLE INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N2223/204 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 2 patents
- Example: 20250040021. X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME (ANRITSU CORPORATION)
- H04J3/0667 ({Bidirectional timestamps, e.g. NTP or PTP for compensation of clock drift and for compensation of propagation delays (arrangements for monitoring round trip delays in packet switching networks)
- Count: 2 patents
- Example: 20250047404. MEASUREMENT SYSTEM AND TIME INFORMATION CORRECTION METHOD THEREOF (ANRITSU CORPORATION)
- H04W24/06 (Testing, {supervising or monitoring} using simulated traffic)
- Count: 2 patents
- Example: 20250047404. MEASUREMENT SYSTEM AND TIME INFORMATION CORRECTION METHOD THEREOF (ANRITSU CORPORATION)
- G01R31/3171 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits)
- Count: 2 patents
- Example: 20250020717. ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD (ANRITSU CORPORATION)
Emerging Technology Areas
- H03M1/1245 ({Sampling or signal conditioning arrangements specially adapted for A/D converters})
- Count: 1 patents
- Example: 20250106074. SIGNAL GENERATION APPARATUS AND SIGNAL GENERATION METHOD (ANRITSU CORPORATION)
- H04L27/22 (Demodulator circuits; Receiver circuits)
- Count: 1 patents
- Example: 20250106074. SIGNAL GENERATION APPARATUS AND SIGNAL GENERATION METHOD (ANRITSU CORPORATION)
- H04B1/40 (TRANSMISSION)
- Count: 1 patents
- Example: 20250106074. SIGNAL GENERATION APPARATUS AND SIGNAL GENERATION METHOD (ANRITSU CORPORATION)
- H04L25/4917 ({using multilevel codes})
- Count: 1 patents
- Example: 20250106074. SIGNAL GENERATION APPARATUS AND SIGNAL GENERATION METHOD (ANRITSU CORPORATION)
- G01N2223/304 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 1 patents
- Example: 20250085239. MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N2223/3037 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 1 patents
- Example: 20250085239. MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS (ANRITSU CORPORATION)
- G01N2223/50 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 1 patents
- Example: 20250093283. X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF (ANRITSU CORPORATION)
- G01N2223/303 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
- Count: 1 patents
- Example: 20250093283. X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF (ANRITSU CORPORATION)
- G21F1/08 (PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR (radiation protection by pharmaceutical means)
- C01P2006/32 (Thermal properties)
Top Inventors
- Jyunichi MORIYA (3 patents)
- Naoya SAITO (3 patents)
- Tatsuya IWAI (3 patents)
- Hironori YOSHIOKA (3 patents)
- Koji FUKAZAWA (2 patents)
- Hiroyuki TANIKAGE (2 patents)
- Takashi KANAI (1 patent)
- Takeshi YAMAZAKI (1 patent)
- Kengo ODA (1 patent)
- Ryohei ISHIKAWA (1 patent)
Patent Categories
Geographical Distribution of Inventors
Geographical Distribution of US Inventors
ANRITSU CORPORATION Inventor States 2025 - Up to April 2025
AI-Related Patents
ANRITSU CORPORATION has filed 2 AI-related patent applications in 2025.
ANRITSU CORPORATION AI Technology Areas 2025 - Up to April 2025
ANRITSU CORPORATION AI Patent Categories 2025 - Up to April 2025
ANRITSU CORPORATION AI Patent Trends 2025 - Up to April 2025
Categories:
- Pages with broken file links
- ANRITSU CORPORATION
- Companies
- CPC G01N23/04
- CPC G01N23/083
- CPC G06T7/0002
- CPC G01N2223/3307
- CPC G01N2223/401
- CPC G01N2223/643
- CPC G06T2207/10116
- CPC G06T2207/20021
- CPC G06T2207/30168
- CPC H05G1/06
- CPC G01N23/18
- CPC H05G1/025
- CPC G01N2223/204
- CPC G06T5/50
- CPC G01N2223/1016
- CPC G06T2207/20224
- CPC G01R29/0892
- CPC G06F3/0484
- CPC H04J3/0667
- CPC H04W24/06
- CPC H04W56/001
- CPC H04W52/346
- CPC H04B17/14
- CPC H04W56/003
- CPC G01R31/3171
- CPC G01R31/2841
- CPC G01R31/318572
- CPC C01G41/006
- CPC C01P2006/32
- CPC G21F1/08
- CPC G01N23/10
- CPC G01N2223/303
- CPC G01N2223/50
- CPC G01N2223/3037
- CPC G01N2223/304
- CPC H04L25/4917
- CPC H04B1/40
- CPC H04L27/22
- CPC H03M1/1245
- Patent Trends by Company in 2025