20250232445. Localization Class (Siemens Healthineers AG)
LOCALIZATION AND CLASSIFICATION OF ABNORMALITIES IN MEDICAL IMAGES
Abstract: systems and methods are provided for optimizing a deep learning model. a multi-site dataset associated with different clinical sites and a deployment dataset associated with a deployment clinical site are received. a deep learning model is trained based on the multi-site dataset. the trained deep learning model is optimized based on the deployment dataset. the optimized trained deep learning model is output.
Inventor(s): Ali Kamen, Bin Lou, Bibo Shi, Nicolas Von Roden, Berthold Kiefer, Robert Grimm, Heinrich von Busch, Mamadou Diallo, Tongbai Meng, Dorin Comaniciu, David Jean Winkel, Xin Yu
CPC Classification: G06T7/0014 ({using an image reference approach})
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Categories:
- Patent Applications
- Siemens Healthineers AG
- CPC G06T7/0014
- Ali Kamen of Skillman NJ US
- Bin Lou of Princeton Junction NJ US
- Bibo Shi of Monmouth Junction NJ US
- Nicolas Von Roden of St Gallen CH
- Berthold Kiefer of Erlangen DE
- Robert Grimm of Nürnberg DE
- Heinrich von Busch of Uttenreuth DE
- Mamadou Diallo of Plainsboro NJ US
- Tongbai Meng of Ellicott City MD US
- Dorin Comaniciu of Princeton NJ US
- David Jean Winkel of Basel CH
- Xin Yu of Nashville TN US