VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFERENT WAVELENGTHS

Abstract: a system includes a station to support a workpiece having one or more welds and/or surface features, and first and second vision sensing assemblies. the first assembly is configured to illuminate the workpiece and generate an image of the one or more welds and/or surface features. the first assembly includes a first light source configured to emit light having a first wavelength and a first sensor configured to detect the light having the first wavelength reflected by the workpiece. the second assembly is configured to illuminate the workpiece and generate an image of the one or more welds and/or surface features. the second assembly includes a second light source configured to emit light having a second wavelength and a second sensor configured to detect the light having the second wavelength reflected by the workpiece. other example systems and methods are also disclosed.

Inventor(s): Guangze LI, Brian FISCHER, Hui-ping WANG, Jorge F. ARINEZ

CPC Classification: G01N21/95684 ({Patterns showing highly reflecting parts, e.g. metallic elements})

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