20250231102. Optical Device Metho (SAMSUNG SDI ., .)
OPTICAL DEVICE AND METHOD FOR TRAINING MACHINE LEARNING MODEL FOR WELDING DEFECT INSPECTION
Abstract: an optical device may include an infrared detection unit that detects heat generated at a weldment during welding, a visible light detection unit that detects plasma generated at the weldment and a spectroscopic unit that detects wavelength-specific luminosity at the weldment, wherein the optical device determines an occurrence of welding defects at the weldment based on the detected heat, the detected plasma, and/or the detected wavelength-specific luminosity of the weldment.
Inventor(s): Joonkil Kim, Taegyeong Oh, Juheon Yu, Haeyun Lee, Donghyun Kim, Jonghoon Lee, Soohong Kim, Jihyang Park, Sangwoo Lee, Dmitry Lagunovsky, Sunuk Hwang
CPC Classification: G01N21/31 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))
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- Patent Applications
- SAMSUNG SDI CO., LTD.
- CPC G01N21/31
- Joonkil Kim of Yongin-si KR
- Taegyeong Oh of Yongin-si KR
- Juheon Yu of Yongin-si KR
- Haeyun Lee of Yongin-si KR
- Donghyun Kim of Yongin-si KR
- Jonghoon Lee of Yongin-si KR
- Soohong Kim of Yongin-si KR
- Jihyang Park of Yongin-si KR
- Sangwoo Lee of Yongin-si KR
- Dmitry Lagunovsky of Yongin-si KR
- Sunuk Hwang of Yongin-si KR