METHOD OF PREDICTING SEMICONDUCTOR DEVICE FAILURE RATE AND AN ELECTRONIC DEVICE FOR PERFORMING THE SAME

Abstract: a method of predicting semiconductor device failure rate and an electronic device for performing the method are provided. the method of predicting semiconductor device failure rate includes receiving schematic data for a unit circuit in a first circuit and layout data corresponding to the schematic data, generating, by at least one processor, a netlist based on the schematic data and the layout data, performing a first simulation on the layout data to generate first simulation data for a test point of the layout data corresponding to a first node in the netlist, applying the first simulation data to a second simulation for the first node to generate second simulation data regarding whether the unit circuit is in fail operation, and calculating a failure rate for the first circuit based on the second simulation data.

Inventor(s): JaeHong Kim, Hyein Lee, Hyein Lim, Se-Young Kim, Seongjin Mun

CPC Classification: G06F30/3308 (ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models ))

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