NOISE MODEL GENERATING METHOD AND NOISE MODEL GENERATING DEVICE

Abstract: a noise model generating method includes calculating a transfer function from inside of an integrated circuit of an electric circuit to a measurement point in the electric circuit; acquiring a noise level waveform of a frequency with a high correlation with a trigger signal from measurement results of noise when the integrated circuit is caused to output the trigger signal; and generating the noise model of the integrated circuit on the basis of the transfer function calculated and the noise level waveform acquired. acquiring the noise level waveform further includes: causing the integrated circuit to output a trigger signal; measuring the trigger signal and noise at the measurement point at time intervals to obtain measured values at the measurement point and at the time intervals; performing a conversion operation to generate, for each frequency, the noise level waveform indicating a change of the noise over time on the basis of the measured values at the measurement point; calculating, for each frequency, a correlation value indicating a correlation between the noise level waveform and a change of the trigger signal over time; and performing a filtering operation to extract the noise level waveform of a frequency with a high correlation from the correlation value.

Inventor(s): Hidetoshi MIYAHARA, Yuusuke IMAIZUMI, Atsushi TOMISHIMA

CPC Classification: G01R29/26 (Measuring noise figure; Measuring signal-to-noise ratio)

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