METHOD FOR AUTONOMOUSLY REPAIRING SURFACE DEFECTS IN A WORKPIECE THROUGH SURFACE MODIFICATIONS

Abstract: a method includes: compiling lower-resolution images, captured during a global scan cycle executed over a workpiece, into a virtual model; defining a nominal toolpath and a nominal target force for the workpiece based on a the virtual model; detecting a defect indicator on the workpiece based on the lower-resolution images; accessing a higher-resolution image captured during a local scan cycle over the defect indicator; characterizing the defect indicator as a defect reparable via material removal based on the higher-resolution image; defining a repair toolpath for the defect based on the virtual model; navigating a sanding head over the workpiece according to the repair toolpath to repair the defect; and, during a processing cycle: navigating the sanding head across the workpiece according to the nominal toolpath and deviating the sanding head from the nominal toolpath to maintain forces of the sanding head on the workpiece proximal the nominal target force.

Inventor(s): Avadhoot Ahire, YiWei Chen, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Ashish Kulkarni, Ceasar Navarro, Sagar Panchal, Brual C. Shah

CPC Classification: B25J9/1653 ({parameters identification, estimation, stiffness, accuracy, error analysis})

Search for rejections for patent application number 20250205887