EXAMINATION SYSTEM

Abstract: an examination system () includes a measurement unit () that is movable to change an angle relative to an eyeball () of a subject and rotatably moved around an eye axis of the eyeball () as a rotation axis, an illumination unit () that is mounted on the measurement unit () to irradiate the eyeball (), a first camera unit (l) that is mounted on the measurement unit () to image the eyeball (), and a second camera unit (r) that is mounted on the measurement unit () to image the eyeball (), in which the first camera unit (l) and the second camera unit (r) are independently movable on the measurement unit () to change angles relative to the eyeball ().

Inventor(s): MOTOAKI KOBAYASHI, TOMOYUKI OOTSUKI, YUGO KATSUKI

CPC Classification: A61B3/145 (Arrangements specially adapted for eye photography {(apparatus or arrangements for taking photographs per se )})

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