Permittivity Measurement Method, Permittivity Measurement System, Permittivity Measurement Program

Abstract: a method includes the steps of acquiring an admittance of a calibration standard of which a dielectric constant is known, measuring a first reflection coefficient, calculating an open reflection coefficient in an ideal open state of a dielectric spectroscopy sensor on the basis of the first reflection coefficient and the admittance of the calibration standard when the calibration standard is installed on a measurement end surface, calculating a reflection coefficient of another calibration standard other than the first calibration standard on the basis of the open reflection coefficient and an admittance of the another calibration standard, measuring a reflection coefficient of a target object, and calculating a dielectric constant of the target object on the basis of the first reflection coefficient, the reflection coefficient of the another calibration standard, the reflection coefficient of the target object, the admittance of the first calibration standard, and the admittance of the another calibration standard.

Inventor(s): Masahito Nakamura, Takuro Tajima, Michiko Seyama, Ayumi Ikeda

CPC Classification: G01N27/026 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))

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