X-RAY APPARATUS AND RELEVANT OPERATING METHOD FOR THE ANALYSIS OF NONFERROUS METALS

Abstract: an x-ray apparatus for the analysis of nonferrous metals includes an x-ray source that produces a low-energy radiation beam and an x-ray spectrometer, these components being arranged close enough to each other and to a sample to be analyzed to be able to simultaneously perform both fluorescence and compton backscattering analysis using both phenomena to identify both metallic and nonmetallic light materials, particularly for the separation of aluminum and magnesium light alloys.

Inventor(s): Danilo PACELLA, Federica CAUSA

CPC Classification: G01N23/2206 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))

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