TESTING CIRCUIT

Abstract: a circuit for testing a dut (device under test) includes an inductor coupled to a first switch, and the first switch is coupled to a second switch. the circuit includes a test module coupled to the first switch and the second switch. the test module includes a dut. the circuit also includes a tvs (transient voltage suppressor) coupled to the second switch.

Inventor(s): SWARNA SAGAR, GEORGE THOTTAN, ABHINAY PATIL

CPC Classification: G01R31/74 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits ))

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