20250180642. Apparatus (Microchip Technology Incorporated)
Apparatus and Method for Clock Frequency Estimation With Delayed Measurements
Abstract: an apparatus includes a clock signal input, a sampling circuit, and an estimation circuit. the clock signal input receives n time measurements. a time measurement denotes a respective portion of a given cycle of a clock signal. the sampling circuit is to generate a first sampled window based upon a first time measurement and a first previous time measurement received m time measurements earlier than the first time measurement. the sampling circuit is to generate a second sampled window based upon a second time measurement and a second previous time measurement received m time measurements earlier than the second time measurement. the estimation circuit is to estimate the frequency or period of the clock signal based upon the first sampled window and the second sampled window.
Inventor(s): Gary Qu Jin, Kamran Rahbar
CPC Classification: G01R31/31725 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits ))
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