Combined Scatter and Transmission Multi-View Imaging System

Abstract: the present specification discloses a multi-view x-ray inspection system having, in one of several embodiments, a three-view configuration with three x-ray sources. each x-ray source rotates and is configured to emit a rotating x-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two x-ray sources.

Inventor(s): Edward James Morton

CPC Classification: G01N23/04 (and forming images of the material)

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