THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM

Abstract: disclosed in the present application is a three-dimensional (3d) contour measurement system. the 3d contour measurement system includes a light source unit, an image acquisition unit, and a control device. the light source unit emits light beam, the light source modulation unit modulates the light beam into a structured light with a preset frequency. the image acquisition unit acquires a stripe image of the object. the control device processes the stripe image to obtain a spectral image, obtains a first phase corresponding to a first structured light, a second phase corresponding to the second structured light, and an equivalent phase corresponding to the structured light based on the spectral region, and obtains a contour height of the object based on the first phase, the second phase, and the equivalent phase.

Inventor(s): HSUAN-WEI HO

CPC Classification: G01B11/2441 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS)

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