METHODS, SYSTEMS, COMPUTER PROGRAMS AND COMPUTER-READABLE MEDIA FOR AUTOMATICALLY DESIGNING A WORKFLOW TO PERFORM A SEMICONDUCTOR INSPECTION TASK

Abstract: a computer implemented method for automatically designing a workflow for semiconductor inspection comprises: receiving input data to be processed by the workflow; receiving a natural language text describing at least a desired output of the workflow; using the natural language text as input to a trained workflow proposal machine learning model that generates one or more workflow proposals, each comprising a sequence of action items to generate the desired output when applied to the input data; prompting a user to confirm a workflow proposal; and applying the confirmed workflow proposal to the input data to perform a semiconductor inspection task. corresponding computer programs, computer-readable media and systems are provided.

Inventor(s): Abhilash Srikantha

CPC Classification: G06Q10/0633 (Workflow analysis)

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