MEASUREMENT CHIP, MEASURING DEVICE AND MEASURING METHOD

Abstract: embodiments of the present disclosure provide a measurement chip. the measurement chip may include a propagation layer configured to allow light to propagate in a propagation direction, an introductory part configured to introduce the light into the propagation layer, an outgoing part configured to outgo the light from the propagation layer, and a coating layer configured to be formed on a surface of the propagation layer. a length of a formed region of the coating layer in the propagating direction is increased or decreased along a direction perpendicular to the propagating direction. the length of the formed region of the coating layer is modifiable using a ligand that reacts with an analyte on the surface of the propagation layer at least in an exposed area that is exposed from the coating layer.

Inventor(s): Keiji TADA, Takeshi KAWAJIRI, Syoichiro KAJI

CPC Classification: G01N21/7703 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))

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