20250172475. Imaging Device Imaging M (NIKON)
IMAGING DEVICE AND IMAGING METHOD
Abstract: an imaging device () includes a substrate (), a first optical system (), and an imaging part (). a subject () is disposed on the substrate (). the first optical system () irradiates the subject () with first emitted light (l). the imaging part () images an interference image between first reflected light (l) and second reflected light (l). the first reflected light (l) is the first emitted light (l) reflected at a first interface (f) conforming to an outer surface of the subject (). the second reflected light (l) is the first emitted light (l) reflected at a second interface (f) between the subject () and the substrate ().
Inventor(s): Masaki MORIYAMA, Naoya ISHIZAWA, Ryo KOBAYASHI, Makiko TAKUBO, Seri HAYASHI, Shuhei TANAKA, Masataka MURAKAMI, Tetsuro HOSHINO, Akio IWASA, Masafumi MIMURA, Naoki FUKUTAKE, Kiyoshi NOZAKI
CPC Classification: G01N15/0227 (Investigating particle size or size distribution (by measuring osmotic pressure ; investigating sedimentation of particle suspensions ; investigating individual particles ))
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- Patent Applications
- NIKON CORPORATION
- CPC G01N15/0227
- Masaki MORIYAMA of Kawasaki-shi JP
- Naoya ISHIZAWA of Saitama-shi JP
- Ryo KOBAYASHI of Kawasaki-shi JP
- Makiko TAKUBO of Sagamihara-shi JP
- Seri HAYASHI of Tokyo JP
- Shuhei TANAKA of Yokohama-shi JP
- Masataka MURAKAMI of Yokohama-shi JP
- Tetsuro HOSHINO of Kawasaki-shi JP
- Akio IWASA of Yokohama-shi JP
- Masafumi MIMURA of Ageo-shi JP
- Naoki FUKUTAKE of Tokyo JP
- Kiyoshi NOZAKI of Sagamihara-shi JP