20250167443. Methods Measurement Systems Precisely Evalu (Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.)
METHODS AND MEASUREMENT SYSTEMS FOR PRECISELY EVALUATING A DEVICE UNDER TEST
Abstract: a method includes defining a center-of-radiation reference for a device under test, the corr indicating a reference origin of an electromagnetic wave pattern formable with the dut; determining a 3-dimensional orientation information with respect to the corr, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern; and providing the corr and the 3-dimensional orientation information to a measurement system.
Inventor(s): Paul Simon Holt LEATHER, Ramez ASKAR, Kei SAKAGUCHI, Thomas HAUSTEIN, Leszek RASCHKOWSKI
CPC Classification: H01Q3/267 ({Phased-array testing or checking devices})
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