PREDICTION OF DATA RETENTION DEGRADATION OF A NON-VOLATILE MEMORY DEVICE BASED ON A MACHINE LEARNING ALGORITHM

Abstract: a controller, of a solid state drive (ssd), may perform, on one or more blocks of a non-volatile memory device of the ssd, read operations using pre-determined threshold voltages associated with two overlapped charge states. the read operations may be performed after a power-on condition following a power-off condition on the non-volatile memory device. the controller may determine, using a machine learning model, a change in threshold voltages associated with the two overlapped charge states, after the power-off condition. the machine learning model may determine the change in threshold voltages using bit error rates associated with the read operations. the machine learning model may be trained to determine changes in threshold voltages for the two overlapped charge states, after power-off conditions. the controller may determine adjusted threshold voltages associated with the two overlapped charge states based on the change in threshold voltages.

Inventor(s): Pitamber SHUKLA, Chris NORRIE, Igor ZIPER

CPC Classification: G06F3/0611 ({in relation to response time})

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