METHOD AND DEVICE OF MANUFACTURING SEMICONDUCTOR DEVICE

Abstract: a method of manufacturing a semiconductor device includes: using a semiconductor element to be inspected as a first semiconductor element; using a semiconductor element for obtaining teaching data as a second semiconductor element; obtaining teaching data including a plurality of data related to characteristics of the second semiconductor element; creating a trained model using the teaching data; and determining whether to perform electric test of the first semiconductor element based on an output obtained by inputting a plurality of data related to characteristics of the first semiconductor element into the trained model.

Inventor(s): Tomoo MORINO, Masayuki IWATSUKI

CPC Classification: G01R31/318342 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits ))

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