MEASUREMENT SYSTEM

Abstract: a measurement system is described. the measurement system includes at least one analog-to-digital converter (adc), the at least one adc being configured to receive and digitize a radio frequency (rf) signal, thereby obtaining a digitized rf signal. the measurement system further includes a digital signal processing circuit, the digital signal processing circuit being configured to receive and process the digitized rf signal. in some embodiments, the digital signal processing circuit is configured to: determine whether the at least one adc is operated in an overload operating state based on the digitized rf signal; determine at least one time frame of the digitized rf signal in which the at least one adc is operated in the overload operating state; and determine whether the at least one time frame corresponds to a critical portion of the rf signal or to an uncritical portion of the rf signal.

Inventor(s): Matthias RUENGELER, Gregor FELDHAUS

CPC Classification: G01R31/308 (Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time ))

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